Optical and X-Ray Characterization
Master semiconductor characterization techniques using optical and X-ray methods for analyzing thin films, material properties, and crystal structure.
Master semiconductor characterization techniques using optical and X-ray methods for analyzing thin films, material properties, and crystal structure.
This course cannot be purchased separately - to access the complete learning experience, graded assignments, and earn certificates, you'll need to enroll in the full Semiconductor Characterization Specialization program. You can audit this specific course for free to explore the content, which includes access to course materials and lectures. This allows you to learn at your own pace without any financial commitment.
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What you'll learn
Learn film thickness and refractive index measurement techniques
Master optical characterization methods for semiconductors
Understand X-ray analysis principles and applications
Analyze semiconductor materials using electron microprobe techniques
Evaluate thin film properties and composition
Skills you'll gain
This course includes:
1.2 Hours PreRecorded video
5 quizzes
Access on Mobile, Tablet, Desktop
FullTime access
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There are 6 modules in this course
This comprehensive course explores optical and X-ray characterization techniques essential for semiconductor analysis. Students learn about reflectance spectroscopy, ellipsometry, and photoluminescence for measuring film properties. The curriculum covers electron microprobe X-ray analysis for compositional studies, with practical applications in semiconductor manufacturing. The course concludes with a case study analyzing 40nm MOSFET structures using electron microprobe techniques.
Course Introduction
Module 1 · 8 Minutes to complete
Reflectance Spectroscopy
Module 2 · 55 Minutes to complete
Ellipsometry
Module 3 · 43 Minutes to complete
Photoluminescence
Module 4 · 40 Minutes to complete
Electron Microprobe X-Ray Analysis
Module 5 · 32 Minutes to complete
Course Wrap-up and Project
Module 6 · 1 Hours to complete
Fee Structure
Instructor
Professor of Electrical Engineering at Arizona State University
Dr. Trevor Thornton is a professor in the Ira A. Fulton Schools of Engineering at Arizona State University (ASU), specializing in electrical engineering. He holds a Ph.D. in Physics from Cambridge University and has an extensive academic and industrial background, having published over 150 journal and conference papers and holding seven patents. Dr. Thornton is the founder of RF Micropower, a company focused on commercializing efficient RF and power management integrated circuits based on silicon-on-insulator (SOI) MESFET technology.His research interests encompass a wide range of topics, including silicon-on-insulator MESFETs, electronics for extreme environments, electron transport in nanostructures, and bio-molecular sensors. Before joining ASU in 1998, he held post-doctoral positions at the Cavendish Laboratory in Cambridge and Bell Communications Research in New Jersey, and he was a lecturer at Imperial College London.
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4.7 course rating
10 ratings
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